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Fizika i Tekhnika Poluprovodnikov, 2020, Volume 54, Issue 2, Pages 212–216
DOI: https://doi.org/10.21883/FTP.2020.02.48907.9290
(Mi phts5289)
 

This article is cited in 5 scientific papers (total in 5 papers)

Semiconductor physics

Comparative analysis of injection microdisk lasers based on InGaAsN quantum wells and InAs/InGaAs quantum dots

È. I. Moiseeva, M. V. Maksimova, N. V. Kryzhanovskayaab, O. I. Simchuka, M. M. Kulaginac, S. A. Kadinskayaa, M. Guinad, A. E. Zhukovab

a Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Peter the Great St. Petersburg Polytechnic University
c Ioffe Institute, St. Petersburg
d Tampere University of Technology, Tampere, Finland
Full-text PDF (514 kB) Citations (5)
Abstract: The results are presented on a comparative analysis of the spectral and threshold characteristics of diode microdisk lasers operating at room temperature in a spectral range of 1.2xx $\mu$m with different active regions: InGaAsN/GaAs quantum wells or InAs/InGaAs/GaAs quantum dots. It was found that microlasers of a comparable size with quantum wells have higher lasing threshold compared to microlasers with quantum dots. At the same time, the latter are characterized by a noticeably smaller fraction of the radiated power with the laser modes. They are also characterized by a jump to excited-state optical transition lasing. The InGaAsN-based microdisk lasers lack these disadvantages.
Keywords: microlaser, quantum wells, quantum dots, nitrogen-containing semiconductors.
Funding agency Grant number
Russian Foundation for Basic Research 16-29-03127 офи_м
Ministry of Education and Science of the Russian Federation 3.9787.2017/8.9
This study was supported by the Russian Foundation for Basic Research, project no. 16-29-03127 ofi_m and by the Ministry of Education and Science of the Russian Federation, project 3.9787.2017/8.9.
Received: 20.10.2019
Revised: 29.10.2019
Accepted: 29.10.2019
English version:
Semiconductors, 2020, Volume 54, Issue 2, Pages 263–267
DOI: https://doi.org/10.1134/S1063782620020177
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: È. I. Moiseev, M. V. Maksimov, N. V. Kryzhanovskaya, O. I. Simchuk, M. M. Kulagina, S. A. Kadinskaya, M. Guina, A. E. Zhukov, “Comparative analysis of injection microdisk lasers based on InGaAsN quantum wells and InAs/InGaAs quantum dots”, Fizika i Tekhnika Poluprovodnikov, 54:2 (2020), 212–216; Semiconductors, 54:2 (2020), 263–267
Citation in format AMSBIB
\Bibitem{MoiMakKry20}
\by \`E.~I.~Moiseev, M.~V.~Maksimov, N.~V.~Kryzhanovskaya, O.~I.~Simchuk, M.~M.~Kulagina, S.~A.~Kadinskaya, M.~Guina, A.~E.~Zhukov
\paper Comparative analysis of injection microdisk lasers based on InGaAsN quantum wells and InAs/InGaAs quantum dots
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2020
\vol 54
\issue 2
\pages 212--216
\mathnet{http://mi.mathnet.ru/phts5289}
\crossref{https://doi.org/10.21883/FTP.2020.02.48907.9290}
\elib{https://elibrary.ru/item.asp?id=42571101}
\transl
\jour Semiconductors
\yr 2020
\vol 54
\issue 2
\pages 263--267
\crossref{https://doi.org/10.1134/S1063782620020177}
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  • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
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