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Fizika i Tekhnika Poluprovodnikov, 2020, Volume 54, Issue 11, Pages 1211–1216
DOI: https://doi.org/10.21883/FTP.2020.11.50088.9162
(Mi phts5122)
 

This article is cited in 2 scientific papers (total in 2 papers)

Surface, interfaces, thin films

Effect of the disordering of thin surface layers on the electronic and optical properties of Si(111)

B. E. Umirzakova, D. A. Tashmukhamedovaa, A. K. Tashatovb, N. M. Mustafoevab, D. M. Muradkabilova

a Tashkent State Technical University
b Qarshi Davlat Univesity
Full-text PDF (291 kB) Citations (2)
Abstract: The degree of disordering and the thickness $d$ of disordered layers and their effect on the band gap $E_g$ of single-crystal Si(111) under Ar$^+$-ion bombardment are studied for the first time. It is shown that the $d$ value at ion energies of $E_0$ = 1 and 2 keV is (100–120) and $\sim$(150–160) $\mathring{\mathrm{A}}$, respectively. In this case, the density of states of electrons in the Si(111) valence band significantly changes, the light transmittance decreases to $K$ = 55–60%, and the $E_g$ value increases by $\sim$10%. Under Ni$^+$-ion bombardment, surface disordering is accompanied by a sharp change in the composition of the surface layers and, as a result, the $K$ value decreases to 5–10%. After heating at $T$ = 900 K, nanocrystals (at doses of $D\le$ 10$^{15}$ cm$^{-2}$) and NiSi$_2$ nanofilms (at $D$ = 6 $\times$ 10$^{16}$ cm$^{-2}$) are formed.
Keywords: ion bombardment of Si, electronic properties, optical properties, thin layers, annealing.
Received: 20.05.2019
Revised: 13.07.2019
Accepted: 20.07.2019
English version:
Semiconductors, 2020, Volume 54, Issue 11, Pages 1424–1429
DOI: https://doi.org/10.1134/S1063782620110263
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: B. E. Umirzakov, D. A. Tashmukhamedova, A. K. Tashatov, N. M. Mustafoeva, D. M. Muradkabilov, “Effect of the disordering of thin surface layers on the electronic and optical properties of Si(111)”, Fizika i Tekhnika Poluprovodnikov, 54:11 (2020), 1211–1216; Semiconductors, 54:11 (2020), 1424–1429
Citation in format AMSBIB
\Bibitem{UmiTasTas20}
\by B.~E.~Umirzakov, D.~A.~Tashmukhamedova, A.~K.~Tashatov, N.~M.~Mustafoeva, D.~M.~Muradkabilov
\paper Effect of the disordering of thin surface layers on the electronic and optical properties of Si(111)
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2020
\vol 54
\issue 11
\pages 1211--1216
\mathnet{http://mi.mathnet.ru/phts5122}
\crossref{https://doi.org/10.21883/FTP.2020.11.50088.9162}
\elib{https://elibrary.ru/item.asp?id=44154072}
\transl
\jour Semiconductors
\yr 2020
\vol 54
\issue 11
\pages 1424--1429
\crossref{https://doi.org/10.1134/S1063782620110263}
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  • https://www.mathnet.ru/eng/phts/v54/i11/p1211
  • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
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