P. L. Chechat, V. D. Liauchuk, A. V. Varuyeu, E. A. Liachuk, “Estimation of quality of simple hardware random numbers generator”, PFMT, 2018, no. 2(35), 103

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Problemy Fiziki, Matematiki i Tekhniki (Problems of Physics, Mathematics and Technics), 2018, Issue 2(35), Pages 103–105 (Mi pfmt576)

INFORMATION SCIENCE

Estimation of quality of simple hardware random numbers generator

P. L. Chechat, V. D. Liauchuk, A. V. Varuyeu, E. A. Liachuk

F. Scorina Gomel State University

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Abstract: A simple implementation of a hardware random number generator that uses the avalanche breakdown effect of the bipolar transistor transition is offered. According to the results of statistical experiments, a conclusion is made about the possibility of using this device in various hardware-software systems.

Keywords: hardware random numbers generator, noise generator, avalanche breakdown of a transistor, statistical criterion.

Received: 16.03.2018

Document Type: Article

UDC: 004.353.2

Language: Russian

Citation: P. L. Chechat, V. D. Liauchuk, A. V. Varuyeu, E. A. Liachuk, “Estimation of quality of simple hardware random numbers generator”, PFMT, 2018, no. 2(35), 103–105

Citation in format AMSBIB

\Bibitem{CheLiaVar18}

\by P.~L.~Chechat, V.~D.~Liauchuk, A.~V.~Varuyeu, E.~A.~Liachuk

\paper Estimation of quality of simple hardware random numbers generator

\jour PFMT

\yr 2018

\issue 2(35)

\pages 103--105

\mathnet{http://mi.mathnet.ru/pfmt576}

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https://www.mathnet.ru/eng/pfmt/y2018/i2/p103

Citing articles in Google Scholar: Russian citations, English citations
Related articles in Google Scholar: Russian articles, English articles

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Abstract page:	142
Full-text PDF :	123
References:	17

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