Investigation of characteristics of the flow of pulses of noise diodes working in the mode of microplasma breakdown

The dependences of the intensity of the output pulse flux on the voltage of the reverse bias of the noise diodes and the current flowing through their $p-n$ junction are determined. The main processes influencing the intensity of the output pulse flux of silicon noise diodes operating in the microplasma breakdown mode are established. It is obtained that shock processes, thermal generation and tunneling of carriers of electric charge can be classified as such processes.