|
Mathematical Backgrounds of Computer and Control System Reliability
Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
K. A. Popkov Keldysh Institute of Applied Mathematics, Moscow, Russia
Abstract:
We prove that for any natural $k$, any Boolean function can be implemented by a two-pole contact circuit that is $k$-irredundant and allows a $k$-fault detection test of length no more than $3$ relative to arbitrary connected faults of contacts in groups, where each group consists of one closing and one opening contact. We establish that if the Boolean function is not self-dual, then this bound can be lowered to $2$.
Keywords:
contact circuit, connected faults of contacts, fault detection test, Boolean function.
Citation:
K. A. Popkov, “Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts”, Prikl. Diskr. Mat., 2023, no. 62, 71–82
Linking options:
https://www.mathnet.ru/eng/pdm821 https://www.mathnet.ru/eng/pdm/y2023/i4/p71
|
Statistics & downloads: |
Abstract page: | 47 | Full-text PDF : | 23 | References: | 6 |
|