Path delay fault test design for circuits obtained by covering ROBDDs with CLBs

Combinational circuits extracted from ROBDDs by covering with CLBs are considered. It has been found that each path delay fault manifests itself as robust one. It means that test for single path delay faults is at the same time test for multiple path delay faults. Deriving test pairs for path delay fault is reduced to finding test pattern for 01(10) fault of arcs radiated from the proper vertex of ROBDDs.