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Optics and Spectroscopy, 2019, Volume 127, Issue 6, Pages 981–985
DOI: https://doi.org/10.21883/OS.2019.12.48696.250-19 (Mi os527) 		 
This article is cited in 2 scientific papers (total in 2 papers)

Optical materials

X-ray luminescence of zinc oxide thick films

I. D. Venevtseva, P. A. Rodnyia, A. È. Muslimovb, V. M. Kanevskiib, V. A. Babaevc, A. M. Ismailovc

a Peter the Great St. Petersburg Polytechnic University, 195251, St. Petersburg, Russia
b Federal Scientific Research Center Crystallography and Photonics, Russian Academy of Sciences, 119333, Moscow, Russia
c Dagestan State University, 367000, Makhachkala, Russia
Citations (2)
DOI: https://doi.org/10.21883/OS.2019.12.48696.250-19
Abstract: Samples of thick (about 30 $\mu$m) films of undoped zinc oxide on sapphire prepared by magnetron sputtering using an uncooled target have been investigated. The structural and luminescence properties of the initial films and films subjected to additional recrystallization annealing in air have been studied. The time and temperature-dependent characteristics of the samples are considered. It is shown that annealing in air enhances the structural, optical, and luminescence properties of these films.
Keywords: ZnO thick films, magnetron sputtering method, ZnO green luminescence, temperature dependence of X-ray luminescence, electron microscopy, uncooled target.
Funding agency Grant number
Ministry of Science and Higher Education of the Russian Federation
Russian Foundation for Basic Research 18-29-12099 мк
18-52-76002 ЭРА_а
This study was supported by the Ministry of Science and Higher Education of the Russian Federation within a state order to the Federal Scientific Research Center Crystallography and Photonics of the Russian Academy of Sciences in the part concerning the film preparation and the Russian Foundation for Basic Research, projects nos. 18-29-12099 mk (in the part concerning the structural diagnostics and microscopy of epitaxial films) and 18-52-76002 ERA_a (in the part concerning the investigation of luminescence and scintillation characteristics of epitaxial films).
Received: 09.08.2019
Revised: 09.08.2019
Accepted: 09.09.2019
English version:
Optics and Spectroscopy, 2019, Volume 127, Issue 6, Pages 1075–1079
DOI: https://doi.org/10.1134/S0030400X19120282
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: I. D. Venevtsev, P. A. Rodnyi, A. È. Muslimov, V. M. Kanevskii, V. A. Babaev, A. M. Ismailov, “X-ray luminescence of zinc oxide thick films”, Optics and Spectroscopy, 127:6 (2019), 981–985; Optics and Spectroscopy, 127:6 (2019), 1075–1079
Citation in format AMSBIB
\Bibitem{VenRodMus19}
\by I.~D.~Venevtsev, P.~A.~Rodnyi, A.~\`E.~Muslimov, V.~M.~Kanevskii, V.~A.~Babaev, A.~M.~Ismailov
\paper X-ray luminescence of zinc oxide thick films
\jour Optics and Spectroscopy
\yr 2019
\vol 127
\issue 6
\pages 981--985
\mathnet{http://mi.mathnet.ru/os527}
\crossref{https://doi.org/10.21883/OS.2019.12.48696.250-19}
\elib{https://elibrary.ru/item.asp?id=42571250}
\transl
\jour Optics and Spectroscopy
\yr 2019
\vol 127
\issue 6
\pages 1075--1079
\crossref{https://doi.org/10.1134/S0030400X19120282}
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