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This article is cited in 1 scientific paper (total in 1 paper)
Optics of surfaces and interfaces
The contribution of thin absorbing layers to reflection spectra
A. V. Mikhailova, V. L. Kuz'minb a Saint Petersburg State University
b Peter the Great St. Petersburg Polytechnic University
Abstract:
The issue of the contribution from thin surface layers to reflection spectra is considered. The reflection coefficients for the two polarizations of the incident radiation are calculated taking into account the surface-layer anisotropy. It is shown that results obtained are important for use in the modern method of infrared reflection–absorption spectroscopy. The obtained solution is shown to be a generalization of a previously developed approach, which has become widespread, to the case of absorption.
Keywords:
thin surface layers, reflection coefficients.
Received: 07.11.2019 Revised: 25.11.2019 Accepted: 02.12.2019
Citation:
A. V. Mikhailov, V. L. Kuz'min, “The contribution of thin absorbing layers to reflection spectra”, Optics and Spectroscopy, 128:3 (2020), 416–421; Optics and Spectroscopy, 128:3 (2020), 404–409
Linking options:
https://www.mathnet.ru/eng/os457 https://www.mathnet.ru/eng/os/v128/i3/p416
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