Spectral characteristics of the oblique reflection interferometer as a refractive index sensor

The paper presents simulation of the refractive index sensor of the analyzed liquid in the Kretschmann configuration based on an oblique reflective interferometer (RI) and its spectral properties for the first time. The principle of operation of this sensor is based on the effect of inverted surface plasmon resonance (ISPR). The sensitive structure is the metal-dielectric multilayer coating based on a nickel thin film in combination with non-quartewavelength dielectric layers. Modeling of the RI manufacturing process under oblique light incidence is described. Formulas for estimating the sensitivity and spectral width of the reflection maximum of ISPR are given, as well as the figure of merit. It is shown that due to the high quality factor, this type of sensor can have very large figure of merit ($>$ 10$^{3}$).