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This article is cited in 1 scientific paper (total in 1 paper)
Optical sensors and transducers
The effect of high background and dead time of an InGaAs/InP single-photon avalanche photodiode on the registration of microsecond range near-infrared luminescence
P. S. Parfenova, A. P. Litvina, D. A. Onishchuka, K. A. Goncharb, K. Berwickc, A. V. Fedorova, A. V. Baranova a School of Photonics, ITMO University, Saint-Petersburg, Russia
b Department of Physics, Lomonosov Moscow State University, Moscow, Russia
c School of Electrical and Electronic Engineering, Technological University Dublin, Ireland
Abstract:
The effects of a high background count and a microsecond dead time interval on a gated InGaAs/InP single-photon avalanche photodiode (SPAD) during microsecond luminescence decay registration are discussed. It is shown that the background count rate of the SPAD limits its use for time-resolved and steady-spectral measurements, and that a “pile-up” effect appears in the microsecond range.
Keywords:
near-infrared detector; photon counting; single-photon avalanche diode (SPAD), pile-up, counting loss.
Received: 27.01.2020 Revised: 27.01.2020 Accepted: 06.02.2020
Citation:
P. S. Parfenov, A. P. Litvin, D. A. Onishchuk, K. A. Gonchar, K. Berwick, A. V. Fedorov, A. V. Baranov, “The effect of high background and dead time of an InGaAs/InP single-photon avalanche photodiode on the registration of microsecond range near-infrared luminescence”, Optics and Spectroscopy, 128:5 (2020), 669; Optics and Spectroscopy, 128:5 (2020), 674–677
Linking options:
https://www.mathnet.ru/eng/os1123 https://www.mathnet.ru/eng/os/v128/i5/p669
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