Fourier spectroscopy as a method of investigation of photoelectric properties of organic systems

A new method of investigation of photoelectric properties of layered thin-film structures based on broadband Fourier spectroscopy exhibiting a harmonically modulated optical delay is proposed. In contrast to traditional approaches to study photoelectric properties, which are based on application of dispersive spectral devices, the proposed method allows not only simultaneously covering the ultraviolet, visible, and infrared spectral ranges, while demonstrating a wide dynamic range and high spectral resolution, but also easily varying low-frequency modulation of the action of light. The capabilities of the method are demonstrated using a polycrystalline organic heterostructure as an example. Its spectral sensitivity, speed, and specific detectivity are measured. A model and an equivalent electric circuit are proposed for explanation of the results of the measurements.