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This article is cited in 4 scientific papers (total in 4 papers)
PAPERS, PRESENTED AT THE CONFERENCE
Tem study of structure of graphene layers in shungite carbon
V. V. Kovalevskii, I. A. Moshnikov Institute of Geology, Karelian Research Center, RAS, Petrozavodsk, Russia
Abstract:
Shungites have been studied by high-resolution transmission electron microscopy (HRTEM). Two types of carbon layers have been revealed in shungites by HRTEM. The first type, graphite-like carbon layers are characterized by strongly marked hexagonal symmetry. The second type are remarkable for imperfections connected with insignificant disorder in the direction of fringes and the distance between them, and can result from point defects or the pentagonal and heptagonal carbon rings that are signs of fullerene-like structures.
Keywords:
Shungite, High-resolution electron microscopy, Molecular structure.
Received: 20.11.2015
Citation:
V. V. Kovalevskii, I. A. Moshnikov, “Tem study of structure of graphene layers in shungite carbon”, Nanosystems: Physics, Chemistry, Mathematics, 7:1 (2016), 210–213
Linking options:
https://www.mathnet.ru/eng/nano194 https://www.mathnet.ru/eng/nano/v7/i1/p210
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Abstract page: | 40 | Full-text PDF : | 14 |
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