The work was carried out with the financial support of the Ministry of
Education and Science within the framework of the implementation of the Program
of the Moscow Center for Fundamental and Applied Mathematics in agreement
no. 075-15-2022-284.
Citation:
G. Antyufeev, D. S. Romanov, “On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits”, Mat. Zametki, 114:3 (2023), 458–463; Math. Notes, 114:3 (2023), 397–402