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This article is cited in 9 scientific papers (total in 9 papers)
Brief Communications
Length of Diagnostic Tests for Boolean Circuits
N. P. Red'kin Lomonosov Moscow State University
Keywords:
Boolean function, Boolean circuit, circuit diagnostic test.
Received: 23.06.2017
Citation:
N. P. Red'kin, “Length of Diagnostic Tests for Boolean Circuits”, Mat. Zametki, 102:4 (2017), 624–627; Math. Notes, 102:4 (2017), 580–582
Linking options:
https://www.mathnet.ru/eng/mzm11730https://doi.org/10.4213/mzm11730 https://www.mathnet.ru/eng/mzm/v102/i4/p624
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Abstract page: | 265 | Full-text PDF : | 39 | References: | 50 | First page: | 26 |
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