Duality method for estimation of puncture conditions of dielectrics

The limit analysis problem (LAP) for estimation of electrical durability for a dielectric in powerful electric field is examined. The appropriate dual problem is formulated. After the standard piecewise linear continuous FEA the dual LAP is transformed into the problem of mathematical programming with linear limitations as equalities. This finite dimension problem is effectively solved by the standard method of projection of gradient. The numerical results show that the proposed method has the qualitative advantage over standard techniques of estimation of puncture conditions. This method is perspective in Electrical Engineering.