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Matematicheskoe modelirovanie, 2008, Volume 20, Number 6, Pages 79–85 (Mi mm2441)  
This article is cited in 8 scientific papers (total in 8 papers)

Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation

V. S. Kortov, S. V. Zvonarev

Ural State Technical University
Full-text PDF (353 kB) Citations (8)
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Abstract: Based on physical processes a mathematical model and a calculation algorithm of the electron transport in crystalline dielectrics charged under irradiation are developed. The model was approved for calculation of physical processes taking place in charged thin layers SiO2 under the electron bombardment. The results of calculation are in agreement with the experimental data and physical representation that suggest adequacy of proposed model.
Received: 19.07.2007
English version:
Mathematical Models and Computer Simulations, 2009, Volume 1, Issue 3, Pages 412–417
DOI: https://doi.org/10.1134/S2070048209030089
Bibliographic databases:
Language: Russian
Citation: V. S. Kortov, S. V. Zvonarev, “Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation”, Matem. Mod., 20:6 (2008), 79–85; Math. Models Comput. Simul., 1:3 (2009), 412–417
Citation in format AMSBIB
\Bibitem{KorZvo08}
\by V.~S.~Kortov, S.~V.~Zvonarev
\paper Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation
\jour Matem. Mod.
\yr 2008
\vol 20
\issue 6
\pages 79--85
\mathnet{http://mi.mathnet.ru/mm2441}
\zmath{https://zbmath.org/?q=an:1150.78309}
\transl
\jour Math. Models Comput. Simul.
\yr 2009
\vol 1
\issue 3
\pages 412--417
\crossref{https://doi.org/10.1134/S2070048209030089}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84881225091}
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    • This publication is cited in the following 8 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Математическое моделирование
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    Full-text PDF :252
    References:76
    First page:32
     
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