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Solid-State Electronics
Formation of the light extracting surface of IR (850 nm) light-emitting diodes
A. V. Malevskaya, N. A. Kalyuzhnyy, D. A. Malevskii, A. A. Blokhin, M. V. Nakhimovich, N. D. Il'inskaya Ioffe Institute, St. Petersburg, Russia
Abstract:
Investigation of post-growth technology development of IR (850 nm) light-emitting diodes based on AlGaAs/GaAs heterostructures, grown by metalorganic vapour-phase epitaxy, has been carried out. Various methods of texturing and brightening the light extracting diode surfaces have been investigated, and a technology for forming optical elements has been developed. Analyzed was the relationship between chip formation technology and photovoltaic parameters of light-emitting diodes: electroluminescence intensity, optical power and external quantum efficiency. As a result of the developed technology, a twofold optical power value increase was achieved, which amounted > 400 mW at current 800 mA.
Keywords:
IR light-emitting diode, texturing, antireflection coating, optical element.
Received: 22.02.2024 Revised: 05.04.2024 Accepted: 10.04.2024
Citation:
A. V. Malevskaya, N. A. Kalyuzhnyy, D. A. Malevskii, A. A. Blokhin, M. V. Nakhimovich, N. D. Il'inskaya, “Formation of the light extracting surface of IR (850 nm) light-emitting diodes”, Zhurnal Tekhnicheskoi Fiziki, 94:6 (2024), 888–893
Linking options:
https://www.mathnet.ru/eng/jtf6788 https://www.mathnet.ru/eng/jtf/v94/i6/p888
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