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Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 86, Issue 1, Pages 116–120
(Mi jtf6664)
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Electrophysics, electron and ion beams, physics of accelerators
Optimized electron–optical system of a static mass-spectrometer for simultaneous isotopic and chemical analysis
L. N. Gall'ab, S. V. Masyukevichac, V. D. Sachenkoa, N. R. Gall'abc a Institute for Analytical Instrumentation, Russian Academy of Sciences, St. Petersburg
b St. Petersburg Polytechnic University
c Ioffe Institute, St. Petersburg
Abstract:
A new approach to control the linear dimensions of analytical electrophysical systems is suggested. This approach uses the lens properties of electron–optical elements with a curvilinear axis. It is shown that such an approach can be effectively applied, in particular, to synthesize ion–optical systems (IOSs) for static magnetic mass spectrometers and can be implemented owing to off-axis fundamental points, the “poles” of an electron–optical system, introduced earlier by one of the authors. The capabilities of the new approach are demonstrated with the synthesis of the IOS of a static mass spectrometer dedicated for isotopic and chemical analysis with an increased resolution. A new IOS not only provides desired high ion–optical parameters at decreased dimensions of the mass spectrometer as a whole but also makes it possible to loosen requirements for the manufacturing accuracy of IOS main elements.
Keywords:
Mass Analyzer, Optical Element, Chromatic Aberration, Magnetic Analyzer, Charged Particle Beam.
Received: 11.02.2015 Revised: 06.05.2015
Citation:
L. N. Gall', S. V. Masyukevich, V. D. Sachenko, N. R. Gall', “Optimized electron–optical system of a static mass-spectrometer for simultaneous isotopic and chemical analysis”, Zhurnal Tekhnicheskoi Fiziki, 86:1 (2016), 116–120; Tech. Phys., 61:1 (2016), 114–118
Linking options:
https://www.mathnet.ru/eng/jtf6664 https://www.mathnet.ru/eng/jtf/v86/i1/p116
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Abstract page: | 38 | Full-text PDF : | 27 |
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