Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 86, Issue 4, Pages 148–150 (Mi jtf6593)  
This article is cited in 6 scientific papers (total in 6 papers)

Brief Communications

Composition, morphology, and electronic structure of the nanophases created on the SiO$_{2}$ Surface by Ar$^{+}$ ion bombardment

M. B. Yusupjanova, D. A. Tashmukhamedova, B. E. Umirzakov

Tashkent State Technical University
Full-text PDF (397 kB) Citations (6)
Abstract: The influence of Ar$^{+}$ bombardment on the composition and the structure of the SiO$_{2}$/Si surface is studied. A thin Si film is found to form on the SiO$_{2}$ surface subjected to high-dose ion bombardment.
Keywords: Auger Spectrum, Cluster Phase, Nonstoichiometric Oxide, Postimplantation Annealing, Auger Electron Spectroscopy Result.
Received: 08.07.2015
English version:
Technical Physics, 2016, Volume 61, Issue 4, Pages 628–630
DOI: https://doi.org/10.1134/S1063784216040253
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: M. B. Yusupjanova, D. A. Tashmukhamedova, B. E. Umirzakov, “Composition, morphology, and electronic structure of the nanophases created on the SiO$_{2}$ Surface by Ar$^{+}$ ion bombardment”, Zhurnal Tekhnicheskoi Fiziki, 86:4 (2016), 148–150; Tech. Phys., 61:4 (2016), 628–630
Citation in format AMSBIB
\Bibitem{YusTasUmi16}
\by M.~B.~Yusupjanova, D.~A.~Tashmukhamedova, B.~E.~Umirzakov
\paper Composition, morphology, and electronic structure of the nanophases created on the SiO$_{2}$ Surface by Ar$^{+}$ ion bombardment
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2016
\vol 86
\issue 4
\pages 148--150
\mathnet{http://mi.mathnet.ru/jtf6593}
\elib{https://elibrary.ru/item.asp?id=25669415}
\transl
\jour Tech. Phys.
\yr 2016
\vol 61
\issue 4
\pages 628--630
\crossref{https://doi.org/10.1134/S1063784216040253}
Linking options:
  • https://www.mathnet.ru/eng/jtf6593
  • https://www.mathnet.ru/eng/jtf/v86/i4/p148
    • This publication is cited in the following 6 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:37
    Full-text PDF :8
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024