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Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 86, Issue 7, Pages 124–129
(Mi jtf6510)
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This article is cited in 6 scientific papers (total in 6 papers)
Physical electronics
Atomic-force microscopy of submicron films of electroactive polymer
D. D. Karamovab, V. M. Kornilova, A. N. Lachinovab, V. A. Kraikinc, I. A. Ionovac a Bashkir State Pedagogical University n. a. M. Akmulla, Ufa
b Ufa Scientific Center, Russian Academy of Sciences
c Ufa Institute of Chemistry, Ufa Federal Research Center of the Russian Academy of Sciences
Abstract:
Atomic-force microscopy is used to study the supramolecular structure of submicron films of electroactive thermally stable polymer (polydiphenylenephthalide (PDP)). It has been demonstrated that PDP films produced using centrifuging are solid homogeneous films with thicknesses down to several nanometers, which correspond to two or three monomolecular layers. The film volume is structurized at thicknesses greater than 100 nm. The study of the rheological properties of solutions used for film production yields a crossover point that separates the domains of strongly diluted and semidiluted solutions. A transition from the globular structure to the associate structure is observed in films that are produced using solutions with a boundary concentration. A model of the formation of polymer film that involves the presence of associates in the original solution is discussed.
Received: 02.07.2015
Citation:
D. D. Karamov, V. M. Kornilov, A. N. Lachinov, V. A. Kraikin, I. A. Ionova, “Atomic-force microscopy of submicron films of electroactive polymer”, Zhurnal Tekhnicheskoi Fiziki, 86:7 (2016), 124–129; Tech. Phys., 61:7 (2016), 1085–1090
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https://www.mathnet.ru/eng/jtf6510 https://www.mathnet.ru/eng/jtf/v86/i7/p124
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