Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 86, Issue 7, Pages 124–129 (Mi jtf6510)  

This article is cited in 6 scientific papers (total in 6 papers)

Physical electronics

Atomic-force microscopy of submicron films of electroactive polymer

D. D. Karamovab, V. M. Kornilova, A. N. Lachinovab, V. A. Kraikinc, I. A. Ionovac

a Bashkir State Pedagogical University n. a. M. Akmulla, Ufa
b Ufa Scientific Center, Russian Academy of Sciences
c Ufa Institute of Chemistry, Ufa Federal Research Center of the Russian Academy of Sciences
Full-text PDF (660 kB) Citations (6)
Abstract: Atomic-force microscopy is used to study the supramolecular structure of submicron films of electroactive thermally stable polymer (polydiphenylenephthalide (PDP)). It has been demonstrated that PDP films produced using centrifuging are solid homogeneous films with thicknesses down to several nanometers, which correspond to two or three monomolecular layers. The film volume is structurized at thicknesses greater than 100 nm. The study of the rheological properties of solutions used for film production yields a crossover point that separates the domains of strongly diluted and semidiluted solutions. A transition from the globular structure to the associate structure is observed in films that are produced using solutions with a boundary concentration. A model of the formation of polymer film that involves the presence of associates in the original solution is discussed.
Received: 02.07.2015
English version:
Technical Physics, 2016, Volume 61, Issue 7, Pages 1085–1090
DOI: https://doi.org/10.1134/S106378421607015X
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: D. D. Karamov, V. M. Kornilov, A. N. Lachinov, V. A. Kraikin, I. A. Ionova, “Atomic-force microscopy of submicron films of electroactive polymer”, Zhurnal Tekhnicheskoi Fiziki, 86:7 (2016), 124–129; Tech. Phys., 61:7 (2016), 1085–1090
Citation in format AMSBIB
\Bibitem{KarKorLac16}
\by D.~D.~Karamov, V.~M.~Kornilov, A.~N.~Lachinov, V.~A.~Kraikin, I.~A.~Ionova
\paper Atomic-force microscopy of submicron films of electroactive polymer
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2016
\vol 86
\issue 7
\pages 124--129
\mathnet{http://mi.mathnet.ru/jtf6510}
\elib{https://elibrary.ru/item.asp?id=27368464}
\transl
\jour Tech. Phys.
\yr 2016
\vol 61
\issue 7
\pages 1085--1090
\crossref{https://doi.org/10.1134/S106378421607015X}
Linking options:
  • https://www.mathnet.ru/eng/jtf6510
  • https://www.mathnet.ru/eng/jtf/v86/i7/p124
  • This publication is cited in the following 6 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:81
    Full-text PDF :32
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024