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Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 86, Issue 10, Pages 83–88 (Mi jtf6422)  
Solid-State Electronics

Analysis of reliability of semiconductor emitters with different designs of cavities

A. V. Ivanov, V. D. Kurnosov, K. V. Kurnosov, Yu. V. Kurnyavko, A. V. Lobintsov, A. S. Meshkov, V. N. Penkin, V. I. Romantsevich, M. B. Uspenskiy, R. V. Chernov

Polyus Research and Development Institute named after M. F. Stel'makh, Moscow
Full-text PDF (191 kB)
Abstract: We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.
Received: 09.07.2015
Revised: 16.02.2016
English version:
Technical Physics, 2016, Volume 61, Issue 10, Pages 1525–1530
DOI: https://doi.org/10.1134/S1063784216100157
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Ivanov, V. D. Kurnosov, K. V. Kurnosov, Yu. V. Kurnyavko, A. V. Lobintsov, A. S. Meshkov, V. N. Penkin, V. I. Romantsevich, M. B. Uspenskiy, R. V. Chernov, “Analysis of reliability of semiconductor emitters with different designs of cavities”, Zhurnal Tekhnicheskoi Fiziki, 86:10 (2016), 83–88; Tech. Phys., 61:10 (2016), 1525–1530
Citation in format AMSBIB
\Bibitem{IvaKurKur16}
\by A.~V.~Ivanov, V.~D.~Kurnosov, K.~V.~Kurnosov, Yu.~V.~Kurnyavko, A.~V.~Lobintsov, A.~S.~Meshkov, V.~N.~Penkin, V.~I.~Romantsevich, M.~B.~Uspenskiy, R.~V.~Chernov
\paper Analysis of reliability of semiconductor emitters with different designs of cavities
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2016
\vol 86
\issue 10
\pages 83--88
\mathnet{http://mi.mathnet.ru/jtf6422}
\elib{https://elibrary.ru/item.asp?id=27368539}
\transl
\jour Tech. Phys.
\yr 2016
\vol 61
\issue 10
\pages 1525--1530
\crossref{https://doi.org/10.1134/S1063784216100157}
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