Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Zhurnal Tekhnicheskoi Fiziki, 2016, Volume 86, Issue 10, Pages 83–88 (Mi jtf6422)  
Solid-State Electronics

Analysis of reliability of semiconductor emitters with different designs of cavities

A. V. Ivanov, V. D. Kurnosov, K. V. Kurnosov, Yu. V. Kurnyavko, A. V. Lobintsov, A. S. Meshkov, V. N. Penkin, V. I. Romantsevich, M. B. Uspenskiy, R. V. Chernov

Polyus Research and Development Institute named after M. F. Stel'makh, Moscow
Full-text PDF (191 kB)
Abstract: We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.
Received: 09.07.2015
Revised: 16.02.2016
English version:
Technical Physics, 2016, Volume 61, Issue 10, Pages 1525–1530
DOI: https://doi.org/10.1134/S1063784216100157
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Ivanov, V. D. Kurnosov, K. V. Kurnosov, Yu. V. Kurnyavko, A. V. Lobintsov, A. S. Meshkov, V. N. Penkin, V. I. Romantsevich, M. B. Uspenskiy, R. V. Chernov, “Analysis of reliability of semiconductor emitters with different designs of cavities”, Zhurnal Tekhnicheskoi Fiziki, 86:10 (2016), 83–88; Tech. Phys., 61:10 (2016), 1525–1530
Citation in format AMSBIB
\Bibitem{IvaKurKur16}
\by A.~V.~Ivanov, V.~D.~Kurnosov, K.~V.~Kurnosov, Yu.~V.~Kurnyavko, A.~V.~Lobintsov, A.~S.~Meshkov, V.~N.~Penkin, V.~I.~Romantsevich, M.~B.~Uspenskiy, R.~V.~Chernov
\paper Analysis of reliability of semiconductor emitters with different designs of cavities
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2016
\vol 86
\issue 10
\pages 83--88
\mathnet{http://mi.mathnet.ru/jtf6422}
\elib{https://elibrary.ru/item.asp?id=27368539}
\transl
\jour Tech. Phys.
\yr 2016
\vol 61
\issue 10
\pages 1525--1530
\crossref{https://doi.org/10.1134/S1063784216100157}
Linking options:
  • https://www.mathnet.ru/eng/jtf6422
  • https://www.mathnet.ru/eng/jtf/v86/i10/p83
    • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:27
    Full-text PDF :15
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024