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This article is cited in 5 scientific papers (total in 5 papers)
Optics
Two-photon confocal microscopy in the study of the volume characteristics of semiconductors
V. P. Kalinushkin, O. V. Uvarov Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow
Abstract:
Zn–Se crystals are used to analyze prospects for application of two-photon confocal microscopy in the study of plane and volume interband and impurity luminescence in semiconductors. Such maps can be formed with a depth step and planar spatial resolution of several micrometers at distances of up to 1 mm from the surface. The method is used to detect luminescence-active inhomogeneities in crystals and study their structure and luminescence characteristics. Prospects for the application of the two-photon confocal microscopy in the study of direct-band-semiconductors and materials of the fourth group are discussed.
Received: 11.12.2015
Citation:
V. P. Kalinushkin, O. V. Uvarov, “Two-photon confocal microscopy in the study of the volume characteristics of semiconductors”, Zhurnal Tekhnicheskoi Fiziki, 86:12 (2016), 119–123; Tech. Phys., 61:12 (2016), 1876–1879
Linking options:
https://www.mathnet.ru/eng/jtf6374 https://www.mathnet.ru/eng/jtf/v86/i12/p119
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Abstract page: | 39 | Full-text PDF : | 13 |
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