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This article is cited in 1 scientific paper (total in 1 paper)
Solid-State Electronics
Influence of the channel–gate barrier height on the detection properties of a field-effect transistor in the microwave and terahertz ranges
S. Koroleva, N. V. Vostokovab, N. V. D'yakonovac, V. I. Shashkinab a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b Lobachevsky State University of Nizhny Novgorod
c Université Montpellier II, Montpellier, France
Abstract:
The detection properties of a field-effect transistor with a low Schottky barrier gate in the microwave and terahertz ranges has been studied theoretically. Different detector circuits have been considered. The voltage and current distributions along the channel, the input impedance of the transistor, sensitivity, and noise equivalent power have been found. The influence of the Schottky barrier height on the above characteristics has been analyzed.
Received: 28.03.2016 Revised: 03.10.2016
Citation:
S. Korolev, N. V. Vostokov, N. V. D'yakonova, V. I. Shashkin, “Influence of the channel–gate barrier height on the detection properties of a field-effect transistor in the microwave and terahertz ranges”, Zhurnal Tekhnicheskoi Fiziki, 87:5 (2017), 746–753; Tech. Phys., 62:5 (2017), 765–772
Linking options:
https://www.mathnet.ru/eng/jtf6238 https://www.mathnet.ru/eng/jtf/v87/i5/p746
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