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This article is cited in 3 scientific papers (total in 3 papers)
Physical electronics
Total external reflection of X rays from polycrystal solid surface
V. M. Stozharov, V. P. Pronin Herzen State Pedagogical University of Russia, St. Petersburg
Abstract:
Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.
Received: 14.03.2017
Citation:
V. M. Stozharov, V. P. Pronin, “Total external reflection of X rays from polycrystal solid surface”, Zhurnal Tekhnicheskoi Fiziki, 87:12 (2017), 1901–1905; Tech. Phys., 62:12 (2017), 1899–1902
Linking options:
https://www.mathnet.ru/eng/jtf6060 https://www.mathnet.ru/eng/jtf/v87/i12/p1901
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Abstract page: | 38 | Full-text PDF : | 28 |
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