Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 88, Issue 6, Pages 803–807
DOI: https://doi.org/10.21883/JTF.2018.06.46008.2159 (Mi jtf5884) 		 
This article is cited in 4 scientific papers (total in 4 papers)

Theoretical and Mathematical Physics

Simulation of properties of images with atomic resolution in a scanning probe microscope

A. A. Potapovabc, S.Sh. Rekhviashvilid

a Kotel'nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow
b JiNan University (JNU), Guangzhou, China
c Cooperative Chinese-Russian laboratory of informational technologies and signals fractal processing of JNU-IREE RAS, JiNan University (JNU), Guangzhou, China
d Institute of Applied Mathematics and Automatization, Kabardino-Balkar Scientific Center, Russian Academy of Sciences, Nalchik, Russia
Full-text PDF (378 kB) Citations (4)
DOI: https://doi.org/10.21883/JTF.2018.06.46008.2159
Abstract: A method for simulation of images in a scanning probe microscope (SPM) using simultaneous wavelet transform and median filtering is proposed. The wavelet transform with the fourth-order Daubechies kernel is used. Such a transform makes it possible to select details of different scales in the SPM image and, hence, study fractal properties of surfaces. Simulation is used to show that ultrahigh (atomic) resolution is possible in SPM provided that the size of the contact region in the probe–sample system is significantly greater than atomic size and the lattice atoms are randomly distributed. Contrast inversion in the SPM images in the multiscan mode is interpreted.
Received: 09.01.2017
Revised: 07.12.2017
English version:
Technical Physics, 2018, Volume 63, Issue 6, Pages 777–781
DOI: https://doi.org/10.1134/S1063784218060166
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. A. Potapov, S.Sh. Rekhviashvili, “Simulation of properties of images with atomic resolution in a scanning probe microscope”, Zhurnal Tekhnicheskoi Fiziki, 88:6 (2018), 803–807; Tech. Phys., 63:6 (2018), 777–781
Citation in format AMSBIB
\Bibitem{PotRek18}
\by A.~A.~Potapov, S.Sh.~Rekhviashvili
\paper Simulation of properties of images with atomic resolution in a scanning probe microscope
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2018
\vol 88
\issue 6
\pages 803--807
\mathnet{http://mi.mathnet.ru/jtf5884}
\crossref{https://doi.org/10.21883/JTF.2018.06.46008.2159}
\elib{https://elibrary.ru/item.asp?id=34982844}
\transl
\jour Tech. Phys.
\yr 2018
\vol 63
\issue 6
\pages 777--781
\crossref{https://doi.org/10.1134/S1063784218060166}
Linking options:
  • https://www.mathnet.ru/eng/jtf5884
  • https://www.mathnet.ru/eng/jtf/v88/i6/p803
    • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:59
    Full-text PDF :15
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024