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Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 88, Issue 7, Pages 1104–1109
DOI: https://doi.org/10.21883/JTF.2018.07.46188.2525 (Mi jtf5881) 		 
Physical electronics

Reducibility of PbO in lead silicate glasses

A. F. Eremina, O. R. Archegova, R. S. Esenov, A. T. Nakusov

Physicotechnical Department, Khetagurov North-Ossetian State University, Vladikavkaz, Russia
Full-text PDF (420 kB)
DOI: https://doi.org/10.21883/JTF.2018.07.46188.2525
Abstract: X-ray diffraction data and X-ray fluorescence analysis data for microchannel plates are presented. From X-ray diffraction patterns, one can estimate the amount of reduced lead in microchannel plates and make sure of the presence of both metallic lead and semiconducting PbO$_ x$ with a variable oxygen content.
Received: 16.10.2017
Revised: 20.12.2017
English version:
Technical Physics, 2018, Volume 63, Issue 7, Pages 1073–1078
DOI: https://doi.org/10.1134/S1063784218070125
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. F. Eremina, O. R. Archegova, R. S. Esenov, A. T. Nakusov, “Reducibility of PbO in lead silicate glasses”, Zhurnal Tekhnicheskoi Fiziki, 88:7 (2018), 1104–1109; Tech. Phys., 63:7 (2018), 1073–1078
Citation in format AMSBIB
\Bibitem{EreArcEse18}
\by A.~F.~Eremina, O.~R.~Archegova, R.~S.~Esenov, A.~T.~Nakusov
\paper Reducibility of PbO in lead silicate glasses
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2018
\vol 88
\issue 7
\pages 1104--1109
\mathnet{http://mi.mathnet.ru/jtf5881}
\crossref{https://doi.org/10.21883/JTF.2018.07.46188.2525}
\elib{https://elibrary.ru/item.asp?id=35269847}
\transl
\jour Tech. Phys.
\yr 2018
\vol 63
\issue 7
\pages 1073--1078
\crossref{https://doi.org/10.1134/S1063784218070125}
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