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Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 89, Issue 3, Pages 456–459
DOI: https://doi.org/10.21883/JTF.2019.03.47185.243-18
(Mi jtf5678)
 

This article is cited in 1 scientific paper (total in 1 paper)

Physical electronics

Determination of the thicknesses and visualization of ion-exchange waveguides in glasses by scanning electron microscopy

A. I. Lihachev, A. V. Nashchekin, R. V. Sokolov, S. G. Konnikov

Ioffe Institute, St. Petersburg
Full-text PDF (447 kB) Citations (1)
Abstract: The formation of a surface layer with silver and sodium concentration gradients in K8-grade glasses as a result of ion exchange is demonstrated by scanning electron microscopy (SEM) and electron probe X-ray microanalysis. The silver ions enriched layers with different thicknesses, depending on the duration of the ion exchange from the silver melt, are visualized in the secondary electrons mode. SEM data on the thickness of the silver enriched layer are in good agreement with the results of calculation from the diffusion equation for silver in glass. The dependence of the silver concentration on the diffusion depth is obtained using elemental composition mapping over the glass cross section. The presence of a layer with a silver concentration gradient leads to formation of a gradient waveguide. Discrete peaks in silver concentration profiles, caused by specific features of mutual diffusion of sodium and silver ions in glasses, are found.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation RFMEFI62117X0018
Received: 18.06.2018
Revised: 21.09.2018
English version:
Technical Physics, 2019, Volume 64, Issue 3, Pages 418–421
DOI: https://doi.org/10.1134/S1063784219030174
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. I. Lihachev, A. V. Nashchekin, R. V. Sokolov, S. G. Konnikov, “Determination of the thicknesses and visualization of ion-exchange waveguides in glasses by scanning electron microscopy”, Zhurnal Tekhnicheskoi Fiziki, 89:3 (2019), 456–459; Tech. Phys., 64:3 (2019), 418–421
Citation in format AMSBIB
\Bibitem{LihNasSok19}
\by A.~I.~Lihachev, A.~V.~Nashchekin, R.~V.~Sokolov, S.~G.~Konnikov
\paper Determination of the thicknesses and visualization of ion-exchange waveguides in glasses by scanning electron microscopy
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 89
\issue 3
\pages 456--459
\mathnet{http://mi.mathnet.ru/jtf5678}
\crossref{https://doi.org/10.21883/JTF.2019.03.47185.243-18}
\elib{https://elibrary.ru/item.asp?id=37643900}
\transl
\jour Tech. Phys.
\yr 2019
\vol 64
\issue 3
\pages 418--421
\crossref{https://doi.org/10.1134/S1063784219030174}
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  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
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