|
This article is cited in 1 scientific paper (total in 1 paper)
Physical electronics
Determination of the thicknesses and visualization of ion-exchange waveguides in glasses by scanning electron microscopy
A. I. Lihachev, A. V. Nashchekin, R. V. Sokolov, S. G. Konnikov Ioffe Institute, St. Petersburg
Abstract:
The formation of a surface layer with silver and sodium concentration gradients in K8-grade glasses as a result of ion exchange is demonstrated by scanning electron microscopy (SEM) and electron probe X-ray microanalysis. The silver ions enriched layers with different thicknesses, depending on the duration of the ion exchange from the silver melt, are visualized in the secondary electrons mode. SEM data on the thickness of the silver enriched layer are in good agreement with the results of calculation from the diffusion equation for silver in glass. The dependence of the silver concentration on the diffusion depth is obtained using elemental composition mapping over the glass cross section. The presence of a layer with a silver concentration gradient leads to formation of a gradient waveguide. Discrete peaks in silver concentration profiles, caused by specific features of mutual diffusion of sodium and silver ions in glasses, are found.
Received: 18.06.2018 Revised: 21.09.2018
Citation:
A. I. Lihachev, A. V. Nashchekin, R. V. Sokolov, S. G. Konnikov, “Determination of the thicknesses and visualization of ion-exchange waveguides in glasses by scanning electron microscopy”, Zhurnal Tekhnicheskoi Fiziki, 89:3 (2019), 456–459; Tech. Phys., 64:3 (2019), 418–421
Linking options:
https://www.mathnet.ru/eng/jtf5678 https://www.mathnet.ru/eng/jtf/v89/i3/p456
|
Statistics & downloads: |
Abstract page: | 62 | Full-text PDF : | 26 |
|