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Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 89, Issue 3, Pages 409–415
DOI: https://doi.org/10.21883/JTF.2019.03.47177.208-18
(Mi jtf5670)
 

Solid-State Electronics

Numerical and experimental study of an optimized $p$-SOS diode

A. G. Lyublinsky, E. I. Belyakova, I. V. Grekhov

Ioffe Institute, St. Petersburg
Abstract: We report on the results of experimental investigation and numerical simulation of switching of SOS diode with $p^{+}P_{0}n^{+}$ structure and with reduced thickness of $P_0$-base. The proposed 1D diffusion-drift model of electron–hole plasma dynamics is found to be in good agreement with the experiment. The reduction of the $P_0$-base thickness has allowed us to double the output pulse voltage with the same switching current density. This has been reached by a considerable reduction of switching losses as well as due to the formation of the domain of a strong quasi-rectangular electric field at the $P_{0}n^{+}$ junction during the current interruption. As a result, output pulse amplitude considerably exceeds the static breakdown voltage of $P_{0}n^{+}$ junction. This effect has been observed for the first time for high-voltage semiconductor opening switches.
Funding agency Grant number
Russian Science Foundation 14-29-00094
Received: 25.05.2018
English version:
Technical Physics, 2019, Volume 64, Issue 3, Pages 373–379
DOI: https://doi.org/10.1134/S1063784219030186
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. G. Lyublinsky, E. I. Belyakova, I. V. Grekhov, “Numerical and experimental study of an optimized $p$-SOS diode”, Zhurnal Tekhnicheskoi Fiziki, 89:3 (2019), 409–415; Tech. Phys., 64:3 (2019), 373–379
Citation in format AMSBIB
\Bibitem{LyuBelGre19}
\by A.~G.~Lyublinsky, E.~I.~Belyakova, I.~V.~Grekhov
\paper Numerical and experimental study of an optimized $p$-SOS diode
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 89
\issue 3
\pages 409--415
\mathnet{http://mi.mathnet.ru/jtf5670}
\crossref{https://doi.org/10.21883/JTF.2019.03.47177.208-18}
\elib{https://elibrary.ru/item.asp?id=37643892}
\transl
\jour Tech. Phys.
\yr 2019
\vol 64
\issue 3
\pages 373--379
\crossref{https://doi.org/10.1134/S1063784219030186}
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