Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 89, Issue 4, Pages 627–638
DOI: https://doi.org/10.21883/JTF.2019.04.47324.170-18 (Mi jtf5654) 		 
This article is cited in 16 scientific papers (total in 16 papers)

Biomedical physics

X-ray computer methods for studying the structural integrity of seeds and their importance in modern seed science

M. V. Arkhipovab, N. S. Priyatkina, L. P. Gusakovaa, N. N. Potrakhovc, A. Yu. Gryaznovc, V. B. Bessonovc, A. V. Obodovskiic, N. E. Staroverovc

a Agrophysical Research Institute, St. Petersburg
b Northwest Center for Interdisciplinary Food Supply Problems, St. Petersburg
c Saint Petersburg Electrotechnical University "LETI"
Full-text PDF (2147 kB) Citations (16)
DOI: https://doi.org/10.21883/JTF.2019.04.47324.170-18
Abstract: X-ray computer methods of research (projection microfocus radiography and microtomography), which are used to study the problem of hidden defects of seeds and investigate its impact on sowing quality, have been considered. The description and main characteristics of technical means that were used to obtain digital two-dimensional and three-dimensional (tomographic) X-ray images of seeds have been given and the possible ways of their quantitative computer processing and analysis have been discussed. Conclusions about the abilities of the methods of projection microfocus radiography and microtomography to study the features of the internal structures of a seed that are related to the violation of its integrity have been formulated.
Received: 29.04.2018
English version:
Technical Physics, 2019, Volume 64, Issue 4, Pages 582–592
DOI: https://doi.org/10.1134/S1063784219040030
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: M. V. Arkhipov, N. S. Priyatkin, L. P. Gusakova, N. N. Potrakhov, A. Yu. Gryaznov, V. B. Bessonov, A. V. Obodovskii, N. E. Staroverov, “X-ray computer methods for studying the structural integrity of seeds and their importance in modern seed science”, Zhurnal Tekhnicheskoi Fiziki, 89:4 (2019), 627–638; Tech. Phys., 64:4 (2019), 582–592
Citation in format AMSBIB
\Bibitem{ArkPriGus19}
\by M.~V.~Arkhipov, N.~S.~Priyatkin, L.~P.~Gusakova, N.~N.~Potrakhov, A.~Yu.~Gryaznov, V.~B.~Bessonov, A.~V.~Obodovskii, N.~E.~Staroverov
\paper X-ray computer methods for studying the structural integrity of seeds and their importance in modern seed science
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 89
\issue 4
\pages 627--638
\mathnet{http://mi.mathnet.ru/jtf5654}
\crossref{https://doi.org/10.21883/JTF.2019.04.47324.170-18}
\elib{https://elibrary.ru/item.asp?id=37643968}
\transl
\jour Tech. Phys.
\yr 2019
\vol 64
\issue 4
\pages 582--592
\crossref{https://doi.org/10.1134/S1063784219040030}
Linking options:
  • https://www.mathnet.ru/eng/jtf5654
  • https://www.mathnet.ru/eng/jtf/v89/i4/p627
    • This publication is cited in the following 16 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:57
    Full-text PDF :49
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024