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Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 89, Issue 4, Pages 627–638
DOI: https://doi.org/10.21883/JTF.2019.04.47324.170-18 (Mi jtf5654) 		 
This article is cited in 21 scientific papers (total in 21 papers)

Biomedical physics

X-ray computer methods for studying the structural integrity of seeds and their importance in modern seed science

M. V. Arkhipovab, N. S. Priyatkina, L. P. Gusakovaa, N. N. Potrakhovc, A. Yu. Gryaznovc, V. B. Bessonovc, A. V. Obodovskiic, N. E. Staroverovc

a Agrophysical Research Institute, St. Petersburg
b Northwest Center for Interdisciplinary Food Supply Problems, St. Petersburg
c Saint Petersburg Electrotechnical University "LETI"
Full-text PDF (2147 kB) Citations (21)
DOI: https://doi.org/10.21883/JTF.2019.04.47324.170-18
Abstract: X-ray computer methods of research (projection microfocus radiography and microtomography), which are used to study the problem of hidden defects of seeds and investigate its impact on sowing quality, have been considered. The description and main characteristics of technical means that were used to obtain digital two-dimensional and three-dimensional (tomographic) X-ray images of seeds have been given and the possible ways of their quantitative computer processing and analysis have been discussed. Conclusions about the abilities of the methods of projection microfocus radiography and microtomography to study the features of the internal structures of a seed that are related to the violation of its integrity have been formulated.
Received: 29.04.2018
English version:
Technical Physics, 2019, Volume 64, Issue 4, Pages 582–592
DOI: https://doi.org/10.1134/S1063784219040030
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: M. V. Arkhipov, N. S. Priyatkin, L. P. Gusakova, N. N. Potrakhov, A. Yu. Gryaznov, V. B. Bessonov, A. V. Obodovskii, N. E. Staroverov, “X-ray computer methods for studying the structural integrity of seeds and their importance in modern seed science”, Zhurnal Tekhnicheskoi Fiziki, 89:4 (2019), 627–638; Tech. Phys., 64:4 (2019), 582–592
Citation in format AMSBIB
\Bibitem{ArkPriGus19}
\by M.~V.~Arkhipov, N.~S.~Priyatkin, L.~P.~Gusakova, N.~N.~Potrakhov, A.~Yu.~Gryaznov, V.~B.~Bessonov, A.~V.~Obodovskii, N.~E.~Staroverov
\paper X-ray computer methods for studying the structural integrity of seeds and their importance in modern seed science
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 89
\issue 4
\pages 627--638
\mathnet{http://mi.mathnet.ru/jtf5654}
\crossref{https://doi.org/10.21883/JTF.2019.04.47324.170-18}
\elib{https://elibrary.ru/item.asp?id=37643968}
\transl
\jour Tech. Phys.
\yr 2019
\vol 64
\issue 4
\pages 582--592
\crossref{https://doi.org/10.1134/S1063784219040030}
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    • This publication is cited in the following 21 articles:
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