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Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 89, Issue 4, Pages 574–577
DOI: https://doi.org/10.21883/JTF.2019.04.47315.152-18
(Mi jtf5645)
 

This article is cited in 2 scientific papers (total in 2 papers)

Physical science of materials

Synthesis of hexagonal AlN и GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy

V. N. Bessolova, E. V. Gushchinaa, E. V. Konenkovaa, S. D. Konenkovb, T. V. L'vovaa, V. N. Panteleeva, M. P. Scheglova

a Ioffe Institute, St. Petersburg
b Saint Petersburg State University
Full-text PDF (490 kB) Citations (2)
Abstract: Synthesis of AlN and GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy has been considered. The process includes sulfidizing of the silicon surface, nucleation and growth of an AlN layer, and then formation of a GaN/AlN structure. It has been found that in the case of a (100)Si substrate, GaN nucleates on buffer AlN layers that may have two crystallographic orientations in contrast to a Si(111) substrate, on which a buffer layer may have only one orientation. It has been shown that the treatment of the Si(100) substrate in an aqueous solution of (NH$_4$)$_2$S decreases the FWHM of the rocking curve for GaN(0002) by a factor of 1.5.
Received: 16.04.2018
English version:
Technical Physics, 2019, Volume 64, Issue 4, Pages 531–534
DOI: https://doi.org/10.1134/S1063784219040054
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. N. Bessolov, E. V. Gushchina, E. V. Konenkova, S. D. Konenkov, T. V. L'vova, V. N. Panteleev, M. P. Scheglov, “Synthesis of hexagonal AlN и GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy”, Zhurnal Tekhnicheskoi Fiziki, 89:4 (2019), 574–577; Tech. Phys., 64:4 (2019), 531–534
Citation in format AMSBIB
\Bibitem{BesGusKon19}
\by V.~N.~Bessolov, E.~V.~Gushchina, E.~V.~Konenkova, S.~D.~Konenkov, T.~V.~L'vova, V.~N.~Panteleev, M.~P.~Scheglov
\paper Synthesis of hexagonal AlN и GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 89
\issue 4
\pages 574--577
\mathnet{http://mi.mathnet.ru/jtf5645}
\crossref{https://doi.org/10.21883/JTF.2019.04.47315.152-18}
\elib{https://elibrary.ru/item.asp?id=37643952}
\transl
\jour Tech. Phys.
\yr 2019
\vol 64
\issue 4
\pages 531--534
\crossref{https://doi.org/10.1134/S1063784219040054}
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  • https://www.mathnet.ru/eng/jtf/v89/i4/p574
  • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
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