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Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 89, Issue 7, Pages 1036–1038
DOI: https://doi.org/10.21883/JTF.2019.07.47794.51-18
(Mi jtf5562)
 

This article is cited in 3 scientific papers (total in 3 papers)

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Determination of plasma oscillations in metals using total external reflection of X-rays

V. M. Stozharov

Herzen State Pedagogical University of Russia, St. Petersburg
Full-text PDF (95 kB) Citations (3)
Abstract: A method to determine plasma oscillations in metals with the aid of total external reflection (TER) of X-rays is proposed. It is shown that the plasmon energy, concentration of conduction electrons, and Fermi energies can be calculated using experimentally measured grazing angles of X-rays after TER. Such characteristics depend on crystallographic directions and may depend on the TER depth.
Received: 08.02.2018
Revised: 08.02.2018
Accepted: 04.02.2019
English version:
Technical Physics, 2019, Volume 64, Issue 7, Pages 977–979
DOI: https://doi.org/10.1134/S1063784219070235
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. M. Stozharov, “Determination of plasma oscillations in metals using total external reflection of X-rays”, Zhurnal Tekhnicheskoi Fiziki, 89:7 (2019), 1036–1038; Tech. Phys., 64:7 (2019), 977–979
Citation in format AMSBIB
\Bibitem{Sto19}
\by V.~M.~Stozharov
\paper Determination of plasma oscillations in metals using total external reflection of X-rays
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 89
\issue 7
\pages 1036--1038
\mathnet{http://mi.mathnet.ru/jtf5562}
\crossref{https://doi.org/10.21883/JTF.2019.07.47794.51-18}
\elib{https://elibrary.ru/item.asp?id=41130832}
\transl
\jour Tech. Phys.
\yr 2019
\vol 64
\issue 7
\pages 977--979
\crossref{https://doi.org/10.1134/S1063784219070235}
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  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
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