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This article is cited in 2 scientific papers (total in 2 papers)
XXIII International Symposium on Nanophysics and Nanoelectronics, Nizhny Novgorod, March 11-14, 2019
Measurement error of interferometers with diffraction reference wave
A. A. Akhsakhalyan, D. A. Gavrilin, I. V. Malyshev, N. N. Salashchenko, M. N. Toropov, B. A. Ulasevich, N. N. Tsybin, N. I. Chkhalo Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
Abstract:
An experimental setup and results on aberration of sources of a reference spherical wave (SRSW) based on a single-mode optical fiber with a subwavelength output aperture obtained with the aid of an optical part of recording system (OPRS) are presented. SRSW and OPRS are developed for referenceless interferometer with diffraction reference wave. Methods for minimization of the measurement error are proposed. The SRSW and OPRS provide subnanometer measurement accuracy for optics. An increase in the measurement accuracy of the interferometer to a picometer level is discussed.
Keywords:
interferometry, aberration, diffraction reference wave, optical fiber.
Received: 28.03.2019 Revised: 28.03.2019 Accepted: 15.04.2019
Citation:
A. A. Akhsakhalyan, D. A. Gavrilin, I. V. Malyshev, N. N. Salashchenko, M. N. Toropov, B. A. Ulasevich, N. N. Tsybin, N. I. Chkhalo, “Measurement error of interferometers with diffraction reference wave”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1789–1794; Tech. Phys., 64:11 (2019), 1698–1703
Linking options:
https://www.mathnet.ru/eng/jtf5476 https://www.mathnet.ru/eng/jtf/v89/i11/p1789
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Abstract page: | 60 | Full-text PDF : | 52 |
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