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This article is cited in 4 scientific papers (total in 4 papers)
XXIII International Symposium on Nanophysics and Nanoelectronics, Nizhny Novgorod, March 11-14, 2019
Application of scanning capacitance force microscopy for detecting impurity phases in ferroelectric triglycine sulfate
R. V. Gainutdinova, A. L. Tolstikhinaa, A. K. Lashkovaa, N. V. Beluginaa, V. N. Shutb, S. E. Mozzharovb, I. F. Kashevichbc a Shubnikov Institute of Crystallography, Federal Scientific Research Centre Crystallography and Photonics, Russian Academy of Sciences, Moscow, Russia
b Institute of Technical Acoustics, Academy of Sciences of Belarus, Vitebsk
c Vitebsk State University named after P. M. Masherov
Abstract:
An inhomogeneous ferroelectric (triglycine-sulfate (TGS) single crystal with a TGS–TGS+Cr periodic growth impurity structure) has been investigated by scanning capacitance force microscopy (SCFM). The specific features of mapping capacitance variations when detecting the electrostatic force at double and triple resonance frequencies are considered. The piezoelectric response, surface potential, and surface topography have been measured. It is shown that the capacitance contrast is formed both on domain walls and on TGS and TGS+Cr stripes. It is demonstrated that SCFM at the electrostatic-force double resonance frequency makes it possible to observe the spatial impurity distribution in the ferroelectric structure in the range of Cr concentrations of about 0.02–0.08 wt %.
Keywords:
triglycine sulfate, scanning capacitance force microscopy, profile impurity distribution.
Received: 28.03.2019
Citation:
R. V. Gainutdinov, A. L. Tolstikhina, A. K. Lashkova, N. V. Belugina, V. N. Shut, S. E. Mozzharov, I. F. Kashevich, “Application of scanning capacitance force microscopy for detecting impurity phases in ferroelectric triglycine sulfate”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1692–1698; Tech. Phys., 64:11 (2019), 1602–1608
Linking options:
https://www.mathnet.ru/eng/jtf5460 https://www.mathnet.ru/eng/jtf/v89/i11/p1692
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