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This article is cited in 3 scientific papers (total in 3 papers)
XXIII International Symposium on Nanophysics and Nanoelectronics, Nizhny Novgorod, March 11-14, 2019
Simulation of local error correction of the surface shape by a low-dimensional ion beam
A. K. Chernyshevab, I. V. Malysheva, A. E. Pestova, N. I. Chkhaloa a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b Lobachevsky State University of Nizhny Novgorod
Abstract:
We propose an algorithm for solving the problem of local error correction of the surface shape by a low-dimensional ion beam. The algorithm presumes successive sampling running over protrusions relative to the average height aimed at searching for the optimal etching point satisfying the criterion for the reduction of the sum of derivative moduli on the etching spot. It is shown that the new approach makes it possible to considerably extend the range of spatial frequencies accessible to the action for a given dimension of an ion beam.
Keywords:
EUV optics, surface shape, ion-beam shape correction, ion etching.
Received: 28.03.2019 Revised: 28.03.2019 Accepted: 15.04.2019
Citation:
A. K. Chernyshev, I. V. Malyshev, A. E. Pestov, N. I. Chkhalo, “Simulation of local error correction of the surface shape by a low-dimensional ion beam”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1650–1655; Tech. Phys., 64:11 (2019), 1560–1565
Linking options:
https://www.mathnet.ru/eng/jtf5453 https://www.mathnet.ru/eng/jtf/v89/i11/p1650
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