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This article is cited in 12 scientific papers (total in 12 papers)
XXIII International Symposium on Nanophysics and Nanoelectronics, Nizhny Novgorod, March 11-14, 2019
Development of technological principles for creating a system of microfocus X-ray tubes based on silicon field emission nanocathodes
N. A. Djuzheva, G. D. Demina, N. A. Filippova, I. D. Evsikova, P. Yu. Glagoleva, M. A. Makhiborodaa, N. I. Chkhalob, N. N. Salashchenkob, S. V. Filippovc, A. G. Koloskoc, E. O. Popovc, V. A. Bespalova a National Research University of Electronic Technology
b Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
c Ioffe Institute, St. Petersburg
Abstract:
The technological prospects for the creation of a system of microfocus X-ray tubes with the use of silicon field emission of nanocathodes have been discussed. A numerical analysis of the field-emission current from a nanoscale semiconductor cathode regulated by voltage on a grid electrode has been carried out on the basis of which a scheme for controlling the elements of the matrix of field-emission cathode assemblies has been proposed. The current–voltage characteristics of silicon field emission nanocathodes have been measured. They are in good agreement with the theoretical estimates of the field-emission current. A full technological cycle of the development of elements of microfocus X-ray tubes (a set of field-emission cathode assemblies and a set of anode assemblies) has been performed. The results can be used to create systems of microfocus X-ray tubes for nanolithographic equipment of a new generation.
Received: 28.03.2019 Revised: 28.03.2019 Accepted: 15.04.2019
Citation:
N. A. Djuzhev, G. D. Demin, N. A. Filippov, I. D. Evsikov, P. Yu. Glagolev, M. A. Makhiboroda, N. I. Chkhalo, N. N. Salashchenko, S. V. Filippov, A. G. Kolosko, E. O. Popov, V. A. Bespalov, “Development of technological principles for creating a system of microfocus X-ray tubes based on silicon field emission nanocathodes”, Zhurnal Tekhnicheskoi Fiziki, 89:12 (2019), 1836–1842; Tech. Phys., 64:12 (2019), 1742–1748
Linking options:
https://www.mathnet.ru/eng/jtf5427 https://www.mathnet.ru/eng/jtf/v89/i12/p1836
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