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Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 90, Issue 1, Pages 149–154
DOI: https://doi.org/10.21883/JTF.2020.01.48677.453-18
(Mi jtf5422)
 

This article is cited in 8 scientific papers (total in 8 papers)

Physical electronics

Resistivity of thin carbon films with different $sp$-bonds fractions

I. A. Zavidovskiy, O. A. Streletskii, O. Yu. Nischak, A. A. Haidarov, A. V. Pavlikov

Faculty of Physics, Lomonosov Moscow State University
Abstract: Carbon films with different extents of $sp$ hybridization have been grown by ion–plasma pulsed arc sputtering of graphite in a methane atmosphere. Using Raman scattering and transmission electron microscopy data, it has been shown that the content of the phase including carbon chains with $sp$ hybridization grows with increasing methane concentration in the working volume. The resistivity of carbon films correlates well with the fraction of $sp$-hybridized carbon in the films.
Keywords: $sp$-carbon, amorphous carbon, Raman spectroscopy, electron diffraction, transmission electron microscopy.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation 14.625.21.0041
This study was supported by the Ministry of Education and Science of the Russian Federation, contract no 14.625.21.0041.
Received: 31.12.2018
Revised: 30.05.2019
Accepted: 30.05.2019
English version:
Technical Physics, 2020, Volume 65, Issue 1, Pages 139–144
DOI: https://doi.org/10.1134/S1063784220010272
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: I. A. Zavidovskiy, O. A. Streletskii, O. Yu. Nischak, A. A. Haidarov, A. V. Pavlikov, “Resistivity of thin carbon films with different $sp$-bonds fractions”, Zhurnal Tekhnicheskoi Fiziki, 90:1 (2020), 149–154; Tech. Phys., 65:1 (2020), 139–144
Citation in format AMSBIB
\Bibitem{ZavStrNis20}
\by I.~A.~Zavidovskiy, O.~A.~Streletskii, O.~Yu.~Nischak, A.~A.~Haidarov, A.~V.~Pavlikov
\paper Resistivity of thin carbon films with different $sp$-bonds fractions
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 90
\issue 1
\pages 149--154
\mathnet{http://mi.mathnet.ru/jtf5422}
\crossref{https://doi.org/10.21883/JTF.2020.01.48677.453-18}
\elib{https://elibrary.ru/item.asp?id=42744568}
\transl
\jour Tech. Phys.
\yr 2020
\vol 65
\issue 1
\pages 139--144
\crossref{https://doi.org/10.1134/S1063784220010272}
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  • https://www.mathnet.ru/eng/jtf/v90/i1/p149
  • This publication is cited in the following 8 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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