Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 90, Issue 1, Pages 59–61
DOI: https://doi.org/10.21883/JTF.2020.01.48661.159-19 (Mi jtf5406) 		 
This article is cited in 3 scientific papers (total in 3 papers)

Plasma

Effect of tensile stresses on the breakdown voltage of thin films

A. M. Pashaev, A. Kh. Janakhmadov, A. A. Aliev

National Academy of Aviation, Baku
Full-text PDF (96 kB) Citations (3)
DOI: https://doi.org/10.21883/JTF.2020.01.48661.159-19
Abstract: We consider the problem of electric breakdown of external varnish-and-paint coatings of aircrafts. It is shown that the formation of the breakdown channel in the dielectric field is associated with rupture of polymer macromolecules in stretched regions. It is revealed in experiments with polyester urethane film that the breakdown voltage (dielectric strength) decreases exponentially with increasing tensile stresses.
Keywords: aircraft, coating, breakdown, electric strength, electric discharge, electric erosion, tensile stresses, polyether urethane.
Received: 09.04.2019
Revised: 09.04.2019
Accepted: 27.05.2019
English version:
Technical Physics, 2020, Volume 65, Issue 1, Pages 54–56
DOI: https://doi.org/10.1134/S1063784220010211
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. M. Pashaev, A. Kh. Janakhmadov, A. A. Aliev, “Effect of tensile stresses on the breakdown voltage of thin films”, Zhurnal Tekhnicheskoi Fiziki, 90:1 (2020), 59–61; Tech. Phys., 65:1 (2020), 54–56
Citation in format AMSBIB
\Bibitem{PasJanAli20}
\by A.~M.~Pashaev, A.~Kh.~Janakhmadov, A.~A.~Aliev
\paper Effect of tensile stresses on the breakdown voltage of thin films
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 90
\issue 1
\pages 59--61
\mathnet{http://mi.mathnet.ru/jtf5406}
\crossref{https://doi.org/10.21883/JTF.2020.01.48661.159-19}
\elib{https://elibrary.ru/item.asp?id=42744510}
\transl
\jour Tech. Phys.
\yr 2020
\vol 65
\issue 1
\pages 54--56
\crossref{https://doi.org/10.1134/S1063784220010211}
Linking options:
  • https://www.mathnet.ru/eng/jtf5406
  • https://www.mathnet.ru/eng/jtf/v90/i1/p59
    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:37
    Full-text PDF :33
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024