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Zhurnal Tekhnicheskoi Fiziki, 2020, Volume 90, Issue 8, Pages 1348–1352
DOI: https://doi.org/10.21883/JTF.2020.08.49546.375-19 (Mi jtf5237) 		 
This article is cited in 3 scientific papers (total in 3 papers)

Physical electronics

A study of microwave radiation absorption in ultrathin conducting films

V. V. Starostenko, V. B. Orlenson, A. S. Mazinov, I. Sh. Fitaev

V. I. Vernadsky Crimean Federal University, Simferopol
Full-text PDF (471 kB) Citations (3)
DOI: https://doi.org/10.21883/JTF.2020.08.49546.375-19
Abstract: The interaction between microwave electromagnetic waves and conducting films with a nanometer thickness in the homogeneous region approximation and a structure consisting of micro- and nanoparticles has been numerically simulated. Using rigorous coupled-wave analysis, the dynamics of the changes in the optical coefficients from the values characteristic of a dielectric to the values for a homogeneous conducting film has been investigated and the effect of the size and distribution of conducting islands on the electrodynamic characteristics has been analyzed.
Keywords: microwave radiation, RCWA, metal/dielectric structures, ultra thin films, Fresnel–Airy model.
Received: 22.11.2019
Revised: 03.02.2020
Accepted: 20.03.2020
English version:
Technical Physics, 2020, Volume 65, Issue 8, Pages 1296–1300
DOI: https://doi.org/10.1134/S1063784220080186
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. V. Starostenko, V. B. Orlenson, A. S. Mazinov, I. Sh. Fitaev, “A study of microwave radiation absorption in ultrathin conducting films”, Zhurnal Tekhnicheskoi Fiziki, 90:8 (2020), 1348–1352; Tech. Phys., 65:8 (2020), 1296–1300
Citation in format AMSBIB
\Bibitem{StaOrlMaz20}
\by V.~V.~Starostenko, V.~B.~Orlenson, A.~S.~Mazinov, I.~Sh.~Fitaev
\paper A study of microwave radiation absorption in ultrathin conducting films
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2020
\vol 90
\issue 8
\pages 1348--1352
\mathnet{http://mi.mathnet.ru/jtf5237}
\crossref{https://doi.org/10.21883/JTF.2020.08.49546.375-19}
\elib{https://elibrary.ru/item.asp?id=43870263}
\transl
\jour Tech. Phys.
\yr 2020
\vol 65
\issue 8
\pages 1296--1300
\crossref{https://doi.org/10.1134/S1063784220080186}
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    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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