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This article is cited in 2 scientific papers (total in 2 papers)
Experimental instruments and technique
Dispersion of plasma oscillations in amorphous chalcogenide semiconductors
V. M. Stozharov Herzen State Pedagogical University of Russia, St. Petersburg
Abstract:
Using the method of plasma oscillation dispersion, thin films of amorphous chalcogenide semiconductors have been investigated and the asymmetry in the number of electrons in the region of X-ray total external reflection and plasmon excitation has been calculated. Loop-shaped dispersion curves have been observed, and the mean energies of plasmons, together with plasmon-related internal stresses and film polarization, have been determined. It has been found that internal stresses and polarization in a molybdenum sulfide amorphous film are absent.
Keywords:
dispersion, plasmons, semiconductor, energy, asymmetry.
Received: 26.11.2020 Revised: 17.12.2020 Accepted: 22.12.2020
Citation:
V. M. Stozharov, “Dispersion of plasma oscillations in amorphous chalcogenide semiconductors”, Zhurnal Tekhnicheskoi Fiziki, 91:6 (2021), 1059–1062; Tech. Phys., 66:8 (2021), 938–941
Linking options:
https://www.mathnet.ru/eng/jtf5004 https://www.mathnet.ru/eng/jtf/v91/i6/p1059
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Abstract page: | 35 | Full-text PDF : | 14 |
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