Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Zhurnal Tekhnicheskoi Fiziki, 2021, Volume 91, Issue 10, Pages 1466–1473
DOI: https://doi.org/10.21883/JTF.2021.10.51358.130-21
(Mi jtf4914)
 

This article is cited in 1 scientific paper (total in 1 paper)

XXV International Symposium on Nanophysics and Nanoelectronics, Nizhny Novgorod, March 9--12, 2021
Solids

Comparison of STM and AFM measurements of Mo thin films with the Kardar–Parisi–Zhang model

L. A. Fomina, I. V. Malikova, V. A. Berezina, A. È. Rassadinb, A. B. Loginovc, B. A. Loginovd

a Institute of Microelectronics Technology and High-Purity Materials RAS
b State University – Higher School of Economics, Nizhny Novgorod Branch
c Lomonosov Moscow State University
d National Research University of Electronic Technology
Abstract: The relief of thin Mo epitaxial films grown on the $R$-plane of sapphire has been studied by scanning tunneling microscopy and atomic force microscopy. The region of parameters of the model of the evolution of the surface relief of the Kardar–Parisi–Zhang films is found, in which it corresponds to the obtained experimental results.
Keywords: epitaxial films, refractory metals, rough surface, Oleinik – Lax maximum principle, Cole – Hopf transformation.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation 075-00355-21-00
Received: 29.04.2021
Revised: 29.04.2021
Accepted: 29.04.2021
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: L. A. Fomin, I. V. Malikov, V. A. Berezin, A. È. Rassadin, A. B. Loginov, B. A. Loginov, “Comparison of STM and AFM measurements of Mo thin films with the Kardar–Parisi–Zhang model”, Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021), 1466–1473
Citation in format AMSBIB
\Bibitem{FomMalBer21}
\by L.~A.~Fomin, I.~V.~Malikov, V.~A.~Berezin, A.~\`E.~Rassadin, A.~B.~Loginov, B.~A.~Loginov
\paper Comparison of STM and AFM measurements of Mo thin films with the Kardar--Parisi--Zhang model
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2021
\vol 91
\issue 10
\pages 1466--1473
\mathnet{http://mi.mathnet.ru/jtf4914}
\crossref{https://doi.org/10.21883/JTF.2021.10.51358.130-21}
\elib{https://elibrary.ru/item.asp?id=46491199}
Linking options:
  • https://www.mathnet.ru/eng/jtf4914
  • https://www.mathnet.ru/eng/jtf/v91/i10/p1466
  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Zhurnal Tekhnicheskoi Fiziki Zhurnal Tekhnicheskoi Fiziki
    Statistics & downloads:
    Abstract page:82
    Full-text PDF :62
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024