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Zhurnal Tekhnicheskoi Fiziki, 1990, Volume 60, Issue 9, Pages 43–50
(Mi jtf3979)
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Optics, Quantum Electronics
MEASUREMENT OF MIGRATIONS AND DEFORMATIONS BY THE 4-EXPOSITION
SPECKLE-PHOTOGRAPHY METHOD
V. P. Shchepinov, N. G. Vlasov, S. A. Novikov
Citation:
V. P. Shchepinov, N. G. Vlasov, S. A. Novikov, “MEASUREMENT OF MIGRATIONS AND DEFORMATIONS BY THE 4-EXPOSITION
SPECKLE-PHOTOGRAPHY METHOD”, Zhurnal Tekhnicheskoi Fiziki, 60:9 (1990), 43–50
Linking options:
https://www.mathnet.ru/eng/jtf3979 https://www.mathnet.ru/eng/jtf/v60/i9/p43
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Statistics & downloads: |
Abstract page: | 43 | Full-text PDF : | 25 |
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