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Zhurnal Tekhnicheskoi Fiziki, 1989, Volume 59, Issue 3, Pages 78–83
(Mi jtf3247)
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Solid-State Electronics
STUDY OF REFLECTION COEFFICIENTS OF MULTILAYERED TITANIUM-SILICONE X-RAY
MIRRORS UNDER NORMAL INCIDENCE
S. S. Borisova, I. V. Kozhevnikov, V. V. Kondratenko, V. E. Levashov, I. I. Lyahovskaya, I. F. Mikhaĭlov, A. G. Ponomarenko, S. I. Sagitov, A. I. Fedorenko, V. A. Chirkov, A. S. Shulakov
Citation:
S. S. Borisova, I. V. Kozhevnikov, V. V. Kondratenko, V. E. Levashov, I. I. Lyahovskaya, I. F. Mikhaǐlov, A. G. Ponomarenko, S. I. Sagitov, A. I. Fedorenko, V. A. Chirkov, A. S. Shulakov, “STUDY OF REFLECTION COEFFICIENTS OF MULTILAYERED TITANIUM-SILICONE X-RAY
MIRRORS UNDER NORMAL INCIDENCE”, Zhurnal Tekhnicheskoi Fiziki, 59:3 (1989), 78–83
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https://www.mathnet.ru/eng/jtf3247 https://www.mathnet.ru/eng/jtf/v59/i3/p78
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Abstract page: | 43 | Full-text PDF : | 38 |
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