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Zhurnal Tekhnicheskoi Fiziki, 1983, Volume 53, Issue 2, Pages 351–354 (Mi jtf2196)  
EFFECT OF THE ION RAY REFRACTION ON AN ELECTRIC-FIELD BOUNDARY IN A MASS-SPECTROGRAPH WITH LASER SOURCE OF IONS

A. I. Boriskin, A. S. Bryukhanov, Yu. A. Bykovskii, V. M. Eremenko, V. M. Ivanchenko, I. D. Laptev
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Document Type: Article
Language: Russian
Citation: A. I. Boriskin, A. S. Bryukhanov, Yu. A. Bykovskii, V. M. Eremenko, V. M. Ivanchenko, I. D. Laptev, “EFFECT OF THE ION RAY REFRACTION ON AN ELECTRIC-FIELD BOUNDARY IN A MASS-SPECTROGRAPH WITH LASER SOURCE OF IONS”, Zhurnal Tekhnicheskoi Fiziki, 53:2 (1983), 351–354
Citation in format AMSBIB
\Bibitem{Byk83}
\by A.~I.~Boriskin, A.~S.~Bryukhanov, Yu.~A.~Bykovskii, V.~M.~Eremenko, V.~M.~Ivanchenko, I.~D.~Laptev
\paper EFFECT OF THE ION RAY REFRACTION ON AN ELECTRIC-FIELD BOUNDARY IN A
MASS-SPECTROGRAPH WITH LASER SOURCE OF IONS
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 1983
\vol 53
\issue 2
\pages 351--354
\mathnet{http://mi.mathnet.ru/jtf2196}
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