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Zhurnal Tekhnicheskoi Fiziki, 1984, Volume 54, Issue 11, Pages 2256–2258
(Mi jtf2063)
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Brief Communications
UTILIZATION OF REFRACTOMETRY FOR PHASE-ANALYSIS OF SEMICONDUCTING
AMORPHOUS FILMS (FOR EXAMPLE, AS-S SYSTEM)
N. K. Kiseleva, B. T. Kolomiets, T. V. Cherneva Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad
Received: 10.05.1984
Citation:
N. K. Kiseleva, B. T. Kolomiets, T. V. Cherneva, “UTILIZATION OF REFRACTOMETRY FOR PHASE-ANALYSIS OF SEMICONDUCTING
AMORPHOUS FILMS (FOR EXAMPLE, AS-S SYSTEM)”, Zhurnal Tekhnicheskoi Fiziki, 54:11 (1984), 2256–2258
Linking options:
https://www.mathnet.ru/eng/jtf2063 https://www.mathnet.ru/eng/jtf/v54/i11/p2256
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Abstract page: | 35 | Full-text PDF : | 16 |
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