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Zhurnal Tekhnicheskoi Fiziki, 1986, Volume 56, Issue 3, Pages 619–621 (Mi jtf122)  
Brief Communications

REDUCTION OF IMPLANTED SAMPLE CRYSTALLIZATION DYNAMICS DURING PULSED THERMAL EFFECT

V. V. Ryzhov, I. Yu. Turchanovskiĭ, S. B. Shemyakina

Institute of High Current Electronics, Siberian Branch of the USSR Academy of Sciences, Tomsk
Full-text PDF (449 kB)
Received: 21.04.1985
Bibliographic databases:
Document Type: Article
UDC: 532,7S J
Language: Russian
Citation: V. V. Ryzhov, I. Yu. Turchanovskiǐ, S. B. Shemyakina, “REDUCTION OF IMPLANTED SAMPLE CRYSTALLIZATION DYNAMICS DURING PULSED THERMAL EFFECT”, Zhurnal Tekhnicheskoi Fiziki, 56:3 (1986), 619–621
Citation in format AMSBIB
\Bibitem{RyzTurShe86}
\by V.~V.~Ryzhov, I.~Yu.~Turchanovski{\v\i}, S.~B.~Shemyakina
\paper REDUCTION OF IMPLANTED SAMPLE CRYSTALLIZATION DYNAMICS DURING PULSED
THERMAL EFFECT
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 1986
\vol 56
\issue 3
\pages 619--621
\mathnet{http://mi.mathnet.ru/jtf122}
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