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Zhurnal Tekhnicheskoi Fiziki, 1985, Volume 55, Issue 3, Pages 632–635 (Mi jtf1174)  
Brief Communications

MASS-SPECTROMETER FOR THE SECONDARY ION ANALYSIS

S. P. Karetskaya, V. M. Kel'man, D. K. Daukeev, S. I. Kasymov, A. G. Mit, N. Yu. Saichenko, G. A. Shevelev

Institute of Nuclear Physics, Academy of Sciences of the Kazakh SSR, Alma-Ata
Full-text PDF (526 kB)
Received: 21.02.1984
Bibliographic databases:
Document Type: Article
UDC: 621.384.8
Language: Russian
Citation: S. P. Karetskaya, V. M. Kel'man, D. K. Daukeev, S. I. Kasymov, A. G. Mit, N. Yu. Saichenko, G. A. Shevelev, “MASS-SPECTROMETER FOR THE SECONDARY ION ANALYSIS”, Zhurnal Tekhnicheskoi Fiziki, 55:3 (1985), 632–635
Citation in format AMSBIB
\Bibitem{KarKelDau85}
\by S.~P.~Karetskaya, V.~M.~Kel'man, D.~K.~Daukeev, S.~I.~Kasymov, A.~G.~Mit, N.~Yu.~Saichenko, G.~A.~Shevelev
\paper MASS-SPECTROMETER FOR THE SECONDARY ION ANALYSIS
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 1985
\vol 55
\issue 3
\pages 632--635
\mathnet{http://mi.mathnet.ru/jtf1174}
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