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This article is cited in 1 scientific paper (total in 1 paper)
Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies
Olga A. Maksimovaab, Sergey G. Ovchinnikovab, Nikolay N. Kosyrevb, Sergey A. Lyaschenkocb a Siberian Federal University, Svobodny, 79, Krasnoyarsk, 660041,
Russia
b Kirensky Institute of Physics, Federal Research Center KSC SB RAS,
Akademgorodok, 50/38, Krasnoyarsk, 660036, Russia
c Reshetnev Siberian State Aerospace University, Krasnoyarsky Rabochy, 31, Krasnoyarsk, 660037, Russia
Abstract:
An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model of ferromagnetic reflective films is in focus. The obtained algorithm can be used to control optical and magneto-optical properties during films growth inside vacuum chambers.
Keywords:
magneto-optical ellipsometry, Kerr effect, two-layer model, ferromagnetic metal, reflection, growth control.
Received: 17.11.2016 Received in revised form: 16.01.2017 Accepted: 02.02.2017
Citation:
Olga A. Maksimova, Sergey G. Ovchinnikov, Nikolay N. Kosyrev, Sergey A. Lyaschenko, “Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies”, J. Sib. Fed. Univ. Math. Phys., 10:2 (2017), 223–232
Linking options:
https://www.mathnet.ru/eng/jsfu543 https://www.mathnet.ru/eng/jsfu/v10/i2/p223
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