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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2022, Volume 116, Issue 11, Pages 810–815
DOI: https://doi.org/10.31857/S1234567822230112 (Mi jetpl6820) 		 
This article is cited in 3 scientific papers (total in 3 papers)

METHODS OF THEORETICAL PHYSICS

6H-SiC nanoparticles integrated with an atomic force microscope for scanning quantum sensors

K. V. Likhachev, I. D. Breev, S. V. Kidalov, P. G. Baranov, S. S. Nagalyuk, A. V. Ankudinov, A. N. Anisimov

Ioffe Institute, St. Petersburg, 194021 Russia
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DOI: https://doi.org/10.31857/S1234567822230112
Abstract: We fabricate a quantum magnetic field sensor based on the silicon vacancy centers in 6H-SiC using atomic force microscopy technique. The quantum sensing is based on optically detected magnetic resonance. To implement quantum scanning microscopy, we attach a single 6H-SiC nanoparticle on the tip of the atomic force microscopy cantilever. Our quantum sensors are characterized using optical spectroscopy and electron microscopy. The use of such probes significantly reduces the cost of a quantum sensor and enables the extension of quantum scanning microscopes to physiological and conductive environments.
Funding agency Grant number
Russian Foundation for Basic Research 20-52-76010
Ministry of Science and Higher Education of the Russian Federation СП-2179.2021.5
This work was performed under the ERA.Net RUS plus program and was supported by the Russian Foundation for Basic Research, project no. 20-52-76010. He implantation was supported by the Ion Beam Center (IBC), Helmholtz-Zentrum Dresden-Rossendorf. A.N. Anisimov acknowledges the support of the Council of the President of the Russian Federation for State Support of Young Scientists and Leading Scientific Schools (project no. SP-2179.2021.5).
Received: 10.10.2022
Revised: 10.10.2022
Accepted: 18.10.2022
English version:
Journal of Experimental and Theoretical Physics Letters, 2022, Volume 116, Issue 11, Pages 840–845
DOI: https://doi.org/10.1134/S0021364022602251
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: K. V. Likhachev, I. D. Breev, S. V. Kidalov, P. G. Baranov, S. S. Nagalyuk, A. V. Ankudinov, A. N. Anisimov, “6H-SiC nanoparticles integrated with an atomic force microscope for scanning quantum sensors”, Pis'ma v Zh. Èksper. Teoret. Fiz., 116:11 (2022), 810–815; JETP Letters, 116:11 (2022), 840–845
Citation in format AMSBIB
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\by K.~V.~Likhachev, I.~D.~Breev, S.~V.~Kidalov, P.~G.~Baranov, S.~S.~Nagalyuk, A.~V.~Ankudinov, A.~N.~Anisimov
\paper 6H-SiC nanoparticles integrated with an atomic force microscope for scanning quantum sensors
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2022
\vol 116
\issue 11
\pages 810--815
\mathnet{http://mi.mathnet.ru/jetpl6820}
\crossref{https://doi.org/10.31857/S1234567822230112}
\edn{https://elibrary.ru/menygx}
\transl
\jour JETP Letters
\yr 2022
\vol 116
\issue 11
\pages 840--845
\crossref{https://doi.org/10.1134/S0021364022602251}
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    • This publication is cited in the following 3 articles:
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    References:15
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