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This article is cited in 2 scientific papers (total in 2 papers)
OPTICS AND NUCLEAR PHYSICS
Precise measurement of the optical characteristics of the subsurface layer of solids
L. A. Fedyukhina, A. V. Gorchakovb, N. G. Korobeishchikovb, I. V. Nikolaevb a Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences,
Novosibirsk, 630090 Russia
b Novosibirsk State University, Novosibirsk, 630090 Russia
Abstract:
A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been experimentally tested with refractive index standards. The uniqueness of the reconstruction of the refractive indices of the substrate and subsurface layer, as well as the thickness of the layer, from the measured reflection coefficient of probe radiation near the Brewster angle and the angle of normal incidence has been demonstrated numerically. The measurements of the refractive index of the subsurface layer with an absolute error of 10$^{-4}$ and the thickness of the subsurface layer with a confidence error of $1$ nm have been performed for the first time.
Received: 09.08.2021 Revised: 11.08.2021 Accepted: 11.08.2021
Citation:
L. A. Fedyukhin, A. V. Gorchakov, N. G. Korobeishchikov, I. V. Nikolaev, “Precise measurement of the optical characteristics of the subsurface layer of solids”, Pis'ma v Zh. Èksper. Teoret. Fiz., 114:5 (2021), 304–310; JETP Letters, 114:5 (2021), 256–262
Linking options:
https://www.mathnet.ru/eng/jetpl6498 https://www.mathnet.ru/eng/jetpl/v114/i5/p304
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Abstract page: | 80 | References: | 19 | First page: | 13 |
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