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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2021, Volume 114, Issue 5, Pages 304–310
DOI: https://doi.org/10.31857/S1234567821170031
(Mi jetpl6498)
 

This article is cited in 2 scientific papers (total in 2 papers)

OPTICS AND NUCLEAR PHYSICS

Precise measurement of the optical characteristics of the subsurface layer of solids

L. A. Fedyukhina, A. V. Gorchakovb, N. G. Korobeishchikovb, I. V. Nikolaevb

a Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, 630090 Russia
b Novosibirsk State University, Novosibirsk, 630090 Russia
References:
Abstract: A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been experimentally tested with refractive index standards. The uniqueness of the reconstruction of the refractive indices of the substrate and subsurface layer, as well as the thickness of the layer, from the measured reflection coefficient of probe radiation near the Brewster angle and the angle of normal incidence has been demonstrated numerically. The measurements of the refractive index of the subsurface layer with an absolute error of 10$^{-4}$ and the thickness of the subsurface layer with a confidence error of $1$ nm have been performed for the first time.
Funding agency Grant number
Russian Foundation for Basic Research 20-42-540004
Russian Science Foundation 21-19-00046
This work was supported by the Russian Foundation for Basic Research and Novosibirsk region (project no. 20-42-540004, measurements) and by the Russian Science Foundation (project no. 21-19-00046, preparation of the samples).
Received: 09.08.2021
Revised: 11.08.2021
Accepted: 11.08.2021
English version:
Journal of Experimental and Theoretical Physics Letters, 2021, Volume 114, Issue 5, Pages 256–262
DOI: https://doi.org/10.1134/S0021364021170069
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: L. A. Fedyukhin, A. V. Gorchakov, N. G. Korobeishchikov, I. V. Nikolaev, “Precise measurement of the optical characteristics of the subsurface layer of solids”, Pis'ma v Zh. Èksper. Teoret. Fiz., 114:5 (2021), 304–310; JETP Letters, 114:5 (2021), 256–262
Citation in format AMSBIB
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\paper Precise measurement of the optical characteristics of the subsurface layer of solids
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2021
\vol 114
\issue 5
\pages 304--310
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\crossref{https://doi.org/10.31857/S1234567821170031}
\transl
\jour JETP Letters
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\vol 114
\issue 5
\pages 256--262
\crossref{https://doi.org/10.1134/S0021364021170069}
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