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This article is cited in 1 scientific paper (total in 1 paper)
CONDENSED MATTER
Role of interfaces in the permittivity tensor of thin layers of a ferromagnetic metal
S. G. Ovchinnikovab, O. A. Maksimovaab, S. A. Lyaschenkob, I. A. Yakovlevb, S. N. Varnakovb a Siberian Federal University, Krasnoyarsk, 660041 Russia
b Kirensky Institute of Physics, Federal Research Center KSC, Siberian Branch,
Russian Academy of Sciences, Krasnoyarsk, 660036 Russia
Abstract:
It is known from experimental studies that the components of the permittivity tensor $\varepsilon$ depend on layer thicknesses of multilayer thin films, and for nanometer layers, it is necessary to additionally consider the interlayer interfaces. This study provides an answer to the question of what is the reason for the influence of these interfaces on film properties. It is shown that the contribution of interband matrix elements for ferromagnetic films with off-diagonal components of the permittivity tensor determines the ratio between the diagonal and off-diagonal components of the tensor $\varepsilon$ at a ferromagnetic layer thickness of about 10 nm.
Received: 26.06.2021 Revised: 09.07.2021 Accepted: 09.07.2021
Citation:
S. G. Ovchinnikov, O. A. Maksimova, S. A. Lyaschenko, I. A. Yakovlev, S. N. Varnakov, “Role of interfaces in the permittivity tensor of thin layers of a ferromagnetic metal”, Pis'ma v Zh. Èksper. Teoret. Fiz., 114:3 (2021), 192–195; JETP Letters, 114:3 (2021), 163–165
Linking options:
https://www.mathnet.ru/eng/jetpl6484 https://www.mathnet.ru/eng/jetpl/v114/i3/p192
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Abstract page: | 86 | References: | 14 | First page: | 7 |
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